Time-periodic flows of electrons and holes in semiconductor devices

被引:0
|
作者
Kan, Toru [1 ]
Suzuki, Masahiro [2 ]
机构
[1] Osaka Prefecture Univ, Dept Math Sci, Sakai, Osaka, Japan
[2] Nagoya Inst Technol, Dept Comp Sci & Engn, Nagoya, Aichi 4668555, Japan
基金
日本学术振兴会;
关键词
drift-diffusion model; global stability; initial-boundary value problem; mixed-boundary condition; parabolic-elliptic system; time-periodic solution; DRIFT-DIFFUSION MODEL; ASYMPTOTIC-BEHAVIOR; CARRIER TRANSPORT; BASIC EQUATIONS; EXISTENCE;
D O I
10.1002/mma.8160
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
The main purpose of this paper is mathematical analysis on time-periodic flows of electrons and holes in semiconductors. The flows appear in a situation that alternating-current voltages are applied to devices. In this paper, we study the drift-diffusion model for semiconductors in a three-dimensional bounded domain and investigate the existence and stability of time-periodic solutions. We first derive uniform-in-time estimates of time-global solutions and then prove by the relative entropy method that the difference of any two solutions decays exponentially fast as time tends to infinity. These facts enable us to show the unique existence and global stability of time-periodic solutions.
引用
收藏
页码:6096 / 6130
页数:35
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