Elements Provide a Clue: Nanoscale Characterization of Thin-Film Composite Polyamide Membranes

In this study, we exploit the nitrogen sulfur elemental contrast of thin-film composite (TFC) polyamide membranes and present, for the first time, the application of two elemental analysis techniques, scanning transmission electron microscopy-energy-dispersive X-ray spectroscopy (STEM-EDX) and X-ray photoelectron spectroscopy (XPS) C-60(+) ion-beam sputtering, to elucidate the nanoscale structure and chemical composition of the polyamide polysulfone interface. Although STEM-EDX elemental mapping depicts the presence of a dense polyamide layer at the interface, it is incapable of resolving the elemental contrast at nanoscale resolution at the interfacial zone. Depth-resolved XPS C-60(+) ion-beam sputtering enabled nanoscale characterization of the polyamide polysulfone interface and revealed the presence of a heterogeneous layer that contains both polyamide and polysulfone signatures. Our results have important implications for future studies to elucidate the structure property performance relationship of TFC membranes.