Contribution of thermally scattered electrons to atomic resolution elemental maps

被引:58
|
作者
Forbes, B. D. [1 ]
D'Alfonso, A. J. [1 ]
Williams, R. E. A. [2 ]
Srinivasan, R. [2 ]
Fraser, H. L. [2 ]
McComb, D. W. [2 ]
Freitag, B. [3 ]
Klenov, D. O. [3 ]
Allen, L. J. [1 ]
机构
[1] Univ Melbourne, Sch Phys, Parkville, Vic 3010, Australia
[2] Ohio State Univ, Dept Mat Sci & Engn, Columbus, OH 43210 USA
[3] FEI Co, Eindhoven, Netherlands
来源
PHYSICAL REVIEW B | 2012年 / 86卷 / 02期
基金
澳大利亚研究理事会;
关键词
MICROSCOPY; SPECTROSCOPY; DIFFRACTION; CONTRAST; PROBE;
D O I
10.1103/PhysRevB.86.024108
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electron energy-loss spectroscopy (EELS) and energy dispersive x-ray (EDX) analysis in scanning transmission electron microscopy (STEM) have the ability to produce elemental maps of a specimen at atomic resolution. In this paper we present EELS and EDX maps for the oxygen K shell in < 001 > strontium titanate. The results initially seem to be anomalous since substantially more signal is obtained when the STEM probe is above the columns containing both titanium and oxygen than when it is above those containing only oxygen. This is at variance with the stoichiometry: the density of oxygen in both types of columns is the same. Using theory, we show that an understanding of the direct contribution to the recorded signal from electrons which have been thermally scattered is the key to understanding these results. We contrast these results with elemental maps of < 110 > strontium titanate. While the experimental results are not directly interpretable, they are in concert with simulations from first principles such as those presented in this paper.
引用
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页数:9
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