Anisotropy of optical properties of conjugated polymer thin films by spectroscopic ellipsometry

被引:39
|
作者
Losurdo, M
Bruno, G
Irene, EA
机构
[1] CNR, IMIP, I-70126 Bari, Italy
[2] INSTM Sect Bari, I-70126 Bari, Italy
[3] Univ N Carolina, Dept Chem, Chapel Hill, NC 27599 USA
关键词
D O I
10.1063/1.1610236
中图分类号
O59 [应用物理学];
学科分类号
摘要
Optical properties of thin films of conjugated poly(arylenephenylene) polymers have been determined using variable angle spectroscopic ellipsometry. Dispersion of the complex refractive index parallel, N-parallel to=(n(parallel to)+ik(parallel to)), and perpendicular, N-perpendicular to=(n(perpendicular to)+ik(perpendicular to)), to the film plane are reported for the photon energy range 1.5-5.0 eV. The energy dispersion in the optical properties has been analyzed using a three-phase model and Lorentzian dispersion functions for the polymers. The resonant frequencies of the Lorentzian oscillators describe the fundamental pi-pi(*) optical transition polarized parallel to the polymer chain and indicate additional optical transitions polarized perpendicular to the polymer chain that are introduced by interchain interactions. Dependence of the optical anisotropy and fundamental pi-pi(*) optical transition on the polymer backbone is discussed. (C) 2003 American Institute of Physics.
引用
收藏
页码:4923 / 4929
页数:7
相关论文
共 50 条
  • [1] Anisotropy of optical properties of conjugated polymer thin films by spectroscopic ellipsometry
    [J]. Bruno, G. (cscpgb02@area.ba.cnr.it), 1600, American Institute of Physics Inc. (94):
  • [2] On the optical anisotropy of conjugated polymer thin films
    Campoy-Quiles, M
    Etchegoin, PG
    Bradley, DDC
    [J]. PHYSICAL REVIEW B, 2005, 72 (04)
  • [3] Spectroscopic ellipsometry for polymer thin films
    Hilfiker, JN
    Synowicki, RA
    Bungay, CL
    Carpio, R
    [J]. SOLID STATE TECHNOLOGY, 1998, 41 (10) : 101 - +
  • [4] Determination of optical properties of fluorocarbon polymer thin films by a variable angle spectroscopic ellipsometry
    Lee, KK
    Park, JG
    Shin, HJ
    [J]. OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS, 2000, 588 : 297 - 302
  • [5] Optical Properties of BST Thin Films by Spectroscopic Ellipsometry and Optical Reflectivity
    Chvostova, D.
    Zelezny, V.
    Pajasova, L.
    Simek, D.
    Jelinek, M.
    Matej, Z.
    [J]. FERROELECTRICS, 2008, 370 : 126 - 131
  • [6] Optical properties of PZT thin films by spectroscopic ellipsometry and optical reflectivity
    Chvostova, D.
    Pajasova, L.
    Zelezny, V.
    [J]. PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, 2008, 5 (05): : 1362 - 1365
  • [7] Optical anisotropy in thin films of a blue electroluminescent conjugated polymer
    Sturm, J
    Tasch, S
    Niko, A
    Leising, G
    Toussaere, E
    Zyss, J
    Kowalczyk, TC
    Singer, KD
    Scherf, U
    Huber, J
    [J]. THIN SOLID FILMS, 1997, 298 (1-2) : 138 - 142
  • [8] Spectroscopic Ellipsometry Investigations of Optical Anisotropy in Obliquely Deposited Hafnia Thin Films
    Tokas, R. B.
    Jena, Shuvendu
    Haque, S. Maidul
    Rao, K. Divakar
    Thakur, S.
    Sahoo, N. K.
    [J]. DAE SOLID STATE PHYSICS SYMPOSIUM 2015, 2016, 1731
  • [9] Anisotropic optical constants of electroluminescent conjugated polymer thin films determined by variable-angle spectroscopic ellipsometry
    Winfield, Jessica M.
    Donley, Carrie L.
    Kim, Ji-Seon
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 102 (06)
  • [10] Optical properties of bismuth niobate thin films studied by spectroscopic ellipsometry
    Kang, Y. J.
    Ghong, T. H.
    Jung, Y. W.
    Byun, J. S.
    Kim, S.
    Kim, Y. D.
    Seong, T. -G.
    Cho, K. -H.
    Nahm, S.
    [J]. THIN SOLID FILMS, 2010, 518 (22) : 6526 - 6530