Software-based BIST for analog to digital converters in SoC

Embedded software based self testing has recently become focus of intense research for microprocessor and memories in SoC. In this paper, we used the testing microprocessor and memory for developing software-based self-testing of analog to digital converters in SoC. The advantage of this methodology include at speed testing, low cost, and small test time. Simulation results show that the proposed method can detect not only catastrophic faults but also some parametric faults.