Editorial for the special feature on metrology for particle accelerators

被引：3
|
作者：
Arpaia, Pasquale [1 ]
Durand, Helene Mainaud [2 ]
Russenschuck, Stephan [2 ]
机构：
[1] Univ Naples Federico II, Naples, Italy
[2] CERN, Geneva, Switzerland
来源：
MEASUREMENT SCIENCE AND TECHNOLOGY | 2018年 / 29卷 / 12期
基金：
欧盟地平线“2020”;
关键词：
D O I：
10.1088/1361-6501/aadd28
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页数：3
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