AFM surface investigation of polyethylene modified by ion bombardment

被引：30

作者：

Svorcik, V

Arenholz, E

Hnatowicz, V

Rybka, V

Ochsner, R

Ryssel, H

机构：

[1] Inst Chem Technol, Dept Solid State Engn, CR-16628 Prague, Czech Republic

[2] Johannes Kepler Univ, A-4040 Linz, Austria

[3] Acad Sci Czech Republ, Inst Nucl Phys, CZ-25068 Rez, Czech Republic

[4] Fraunhofer Inst Integrierte Schaltungen, D-91058 Erlangen, Germany

[5] Univ Erlangen Nurnberg, Lehrstuhl Elekt Bauelemente, D-91058 Erlangen, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1998年 / 142卷 / 03期

关键词：

polyethylene; ion implantation; surface morphology and chemistry;

D O I：

10.1016/S0168-583X(98)00288-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Polyethylene (PE) was irradiated with 63 keV Ar+ and 155 keV Xe+ ions to fluences of 1 x 10(13) to 3 x 10(15) cm(-2) with ion energies being chosen in order to achieve approximately the same penetration depth for both species. The PE surface morphology was examined by means of atomic force microscopy (AFM), whereas the concentration of free radicals and conjugated double bonds, both created by the ion irradiation, were determined using electron paramagnetic resonance (EPR) and UV-VIS spectroscopy, respectively. As expected, the degradation of PE was higher after irradiation with heavier Xe+ ions but the changes in the PE surface morphology were more pronounced for Ar+ ions. This newly observed effect can be explained by stronger compaction of the PE surface layer in the case of the Xe+ irradiation, connected with a reduction of free volume available. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：349 / 354

页数：6

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