Electromigration occurences and its effects on metallic surfaces submitted to high electromagnetic field: A novel approach to breakdown in accelerators (vol 665, pg 54, 2011)

被引：10

作者：

Antoine, C. Z. ^{[1
]}

Peauger, F. ^{[1
]}

Le Pimpec, F. ^{[2
]}

机构：

[1] CEA, SACM, Ctr Etud Saclay, F-91191 Gif Sur Yvette, France

[2] PSI, CH-5232 Villigen, Switzerland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2012年 / 670卷

关键词：

SCANNING TUNNELING MICROSCOPE; LIQUID-METAL; ACTIVATION-ENERGY; ELECTRIC-FIELD; SELF-DIFFUSION; HIGH-TEMPERATURE; ION-SOURCE; TIP-SHAPE; EMISSION; COPPER;

D O I：

10.1016/j.nima.2012.01.027

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：79 / 94

页数：16