Integrated optical components on atom chips

被引:35
|
作者
Eriksson, S [1 ]
Trupke, M
Powell, HF
Sahagun, D
Sinclair, CDJ
Curtis, EA
Sauer, BE
Hinds, EA
Moktadir, Z
Gollasch, CO
Kraft, M
机构
[1] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, London SW7 2BW, England
[2] Univ Southampton, Sch Elect & Comp Sci, Southampton SO17 1BJ, Hants, England
来源
EUROPEAN PHYSICAL JOURNAL D | 2005年 / 35卷 / 01期
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1140/epjd/e2005-00092-x
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on the integration of small-scale optical components into silicon wafers for use in atom chips. We present an on-chip fibre-optic atom detection scheme that can probe clouds with small atom numbers. The fibres can also be used to generate microscopic dipole traps. We describe our most recent results with optical microcavities and show that a sufficiently high finesse can be achieved to enable single-atom detection on an atom chip. The key components have been fabricated by etching directly into the atom chip silicon substrate.
引用
收藏
页码:135 / 139
页数:5
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