A numerical study of geometry dependent errors in velocity, temperature, and density measurements from single grid planar retarding potential analyzers

被引:7
|
作者
Davidson, R. L. [1 ]
Earle, G. D. [1 ]
Klenzing, J. H. [2 ]
Heelis, R. A. [1 ]
机构
[1] Univ Texas Dallas, William B Hanson Ctr Space Sci, Richardson, TX 75080 USA
[2] NASA, Goddard Space Flight Ctr, Space Weather Lab Code 674, Greenbelt, MD 20771 USA
关键词
D O I
10.1063/1.3457931
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Planar retarding potential analyzers (RPAs) have been utilized numerous times on high profile missions such as the Communications/Navigation Outage Forecast System and the Defense Meteorological Satellite Program to measure plasma composition, temperature, density, and the velocity component perpendicular to the plane of the instrument aperture. These instruments use biased grids to approximate ideal biased planes. These grids introduce perturbations in the electric potential distribution inside the instrument and when unaccounted for cause errors in the measured plasma parameters. Traditionally, the grids utilized in RPAs have been made of fine wires woven into a mesh. Previous studies on the errors caused by grids in RPAs have approximated woven grids with a truly flat grid. Using a commercial ion optics software package, errors in inferred parameters caused by both woven and flat grids are examined. A flat grid geometry shows the smallest temperature and density errors, while the double thick flat grid displays minimal errors for velocities over the temperature and velocity range used. Wire thickness along the dominant flow direction is found to be a critical design parameter in regard to errors in all three inferred plasma parameters. The results shown for each case provide valuable design guidelines for future RPA development. (C) 2010 American Institute of Physics. [doi:10.1063/1.3457931]
引用
收藏
页数:8
相关论文
共 6 条
  • [1] Errors in ram velocity and temperature measurements inferred from satellite-borne retarding potential analyzers
    Klenzing, J. H.
    Earle, G. D.
    Heelis, R. A.
    PHYSICS OF PLASMAS, 2008, 15 (06)
  • [2] ERRORS IN ION AND ELECTRON-TEMPERATURE MEASUREMENTS DUE TO GRID PLANE POTENTIAL NONUNIFORMITIES IN RETARDING POTENTIAL ANALYZERS
    GOLDAN, PD
    YADLOWSKY, EJ
    WHIPPLE, EC
    JOURNAL OF GEOPHYSICAL RESEARCH, 1973, 78 (16): : 2907 - 2916
  • [3] ERRORS IN ION AND ELECTRON-TEMPERATURE MEASUREMENTS DUE TO GRID PLANE POTENTIAL NONUNIFORMITIES IN RETARDING POTENTIAL ANALYZERS
    GOLDAN, PD
    YADLOWSK.EJ
    WHIPPLE, EC
    TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1973, 54 (02): : 111 - 111
  • [4] A design approach for improving the performance of single-grid planar retarding potential analyzers
    Davidson, R. L.
    Earle, G. D.
    PHYSICS OF PLASMAS, 2011, 18 (01)
  • [5] A statistical analysis of systematic errors in temperature and ram velocity estimates from satellite-borne retarding potential analyzers
    Klenzing, J. H.
    Earle, G. D.
    Heelis, R. A.
    Coley, W. R.
    PHYSICS OF PLASMAS, 2009, 16 (05)
  • [6] Grid effects on the derived ion temperature and ram velocity from the simulated results of the retarding potential analyzer data
    Chao, CK
    Su, SY
    Yeh, HC
    CALIBRATION, CHARACTERIZATION OF SATELLITE SENSORS, PHYSICAL PARAMETERS DERIVED FROM SATELLITE DATA, 2003, 32 (11): : 2361 - 2366