Safe failures impact on Safety Instrumented Systems

被引：0

作者：

Langeron, Yves ^{[1
]}

Barros, Anne ^{[1
]}

Grall, Antoine ^{[1
]}

Berenguer, Christophe ^{[1
]}

机构：

[1] Univ Technol Troyes, ICD, CNRS, FRE 2484, Troyes, France

来源：

RISK, RELIABILITY AND SOCIETAL SAFETY, VOLS 1-3: VOL 1: SPECIALISATION TOPICS; VOL 2: THEMATIC TOPICS; VOL 3: APPLICATIONS TOPICS | 2007年

关键词：

D O I：

暂无

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

This paper deals with continuous Markov models in order to evaluate the impact of safe failures on safety instrumented systems SIS. According to the standard IEC 61508, the main goal is to verify if the probability of failure on demand PFD upon which the safety integrity level SIL is built, and the safe failure fraction SFF, carry enough information to capture completely a SIS behavior.

引用

页码：641 / 648

页数：8

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