Shockley-Read-Hall and Auger Recombination in Blue InGaN Tunnel-Junction Light-Emitting Diodes

被引:3
|
作者
Chang, Jih-Yuan [1 ]
Shih, Ya-Hsuan [2 ]
Huang, Man-Fang [3 ]
Chen, Fang-Ming [3 ]
Kuo, Yen-Kuang [4 ]
机构
[1] Natl Changhua Univ Educ, Ctr Teacher Educ, Changhua 500, Taiwan
[2] Natl Cheng Kung Univ, Dept Photon, Tainan 701, Taiwan
[3] Natl Changhua Univ Educ, Inst Photon, Changhua 500, Taiwan
[4] Natl Changhua Univ Educ, Dept Phys, Changhua 500, Taiwan
关键词
InGaN; light-emitting diodes; tunnel-junction; POLARIZATION; LEVEL;
D O I
10.1002/pssa.201800271
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, performance and characteristics of blue InGaN tunnel-junction light-emitting diode (TJ LED) are investigated theoretically. Simulation results show that, dissimilar to the single LED, Shockley-Read-Hall (SRH) and Auger recombination are critical issues influencing the output performance of blue TJ LEDs in both low and high current regions. In realizing high-performance TJ LEDs, to pursue the advantages of both satisfactory crystalline quality and suppressed SRH recombination loss, a simplified structure with single quantum well and without electron-blocking layer is proposed as the unit LED structure that is utilized to stack the TJ LED. Simulation results indicate that the TJ LED with simplified unit LED structure possesses good performance at high output power, which provides a practical and cost-effective way for the fabrication of TJ LEDs, especially when more unit LEDs need to be cascaded.
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Investigation of Shockley-read-hall Recombination in Deep-ultraviolet Light-emitting Diodes
    Kuo, Yen-Kuang
    Chen, Fang-Ming
    Chang, Jih-Yuan
    OPTICS, PHOTONICS AND LASERS (OPAL 2019), 2019, : 6 - 8
  • [2] Shockley-Read-Hall recombination and efficiency droop in InGaN/GaN multiple-quantum-well green light-emitting diodes
    Liu, Wei
    Zhao, Degang
    Jiang, Desheng
    Chen, Ping
    Liu, Zongshun
    Zhu, Jianjun
    Li, Xiang
    Liang, Feng
    Liu, Jianping
    Zhang, Liqun
    Yang, Hui
    Zhang, Yuantao
    Du, Guotong
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 49 (14)
  • [3] Effects of number of quantum wells and Shockley-Read-Hall recombination in deep-ultraviolet light-emitting diodes
    Chen, Fang-Ming
    Huang, Man-Fang
    Chang, Jih-Yuan
    Kuo, Yen-Kuang
    OPTICS LETTERS, 2020, 45 (13) : 3749 - 3752
  • [4] An enhanced surface passivation effect in InGaN/GaN disk-in-nanowire light emitting diodes for mitigating Shockley-Read-Hall recombination
    Zhao, Chao
    Ng, Tien Khee
    Prabaswara, Aditya
    Conroy, Michele
    Jahangir, Shafat
    Frost, Thomas
    O'Connell, John
    Holmes, Justin D.
    Parbrook, Peter J.
    Bhattacharya, Pallab
    Ooi, Boon S.
    NANOSCALE, 2015, 7 (40) : 16658 - 16665
  • [5] Full quantum simulation of Shockley-Read-Hall recombination in p-i-n and tunnel diodes
    Pilotto, A.
    Dollfus, P.
    Saint-Martin, J.
    Pala, M.
    SOLID-STATE ELECTRONICS, 2022, 198
  • [6] Theoretical Investigation of Efficient Green Tunnel-Junction Light-Emitting Diodes
    Kuo, Yen-Kuang
    Shih, Ya-Hsuan
    Chang, Jih-Yuan
    Chen, Fang-Ming
    Lee, Ming-Lun
    Sheu, Jinn-Kong
    IEEE ELECTRON DEVICE LETTERS, 2017, 38 (01) : 75 - 78
  • [7] Junction optimization in HgCdTe: Shockley-Read-Hall generation-recombination suppression
    Schuster, J.
    DeWames, R. E.
    DeCuir, E. A., Jr.
    Bellotti, E.
    Wijewarnasuriya, P. S.
    APPLIED PHYSICS LETTERS, 2015, 107 (02)
  • [8] Wide-spectrum and high-homogeneity InGaN tunnel-junction light-emitting diode stacked by two unit light-emitting diodes
    Huang, Man-Fang
    Huang, Yen-Lung
    Chang, Jih-Yuan
    Shih, Ya-Hsuan
    Kuo, Yen-Kuang
    MICRO AND NANOSTRUCTURES, 2022, 167
  • [9] Total-InGaN-thickness dependent Shockley-Read-Hall recombination lifetime in InGaN quantum wells
    Zhou, Renlin
    Ikeda, Masao
    Zhang, Feng
    Liu, Jianping
    Zhang, Shuming
    Tian, Aiqin
    Wen, Pengyan
    Li, Deyao
    Zhang, Liqun
    Yang, Hui
    JOURNAL OF APPLIED PHYSICS, 2020, 127 (01)
  • [10] Total-InGaN-thickness dependent Shockley-Read-Hall recombination lifetime in InGaN quantum wells
    Zhou, Renlin
    Ikeda, Masao
    Zhang, Feng
    Liu, Jianping
    Zhang, Shuming
    Tian, Aiqin
    Wen, Pengyan
    Li, Deyao
    Zhang, Liqun
    Yang, Hui
    Journal of Applied Physics, 2020, 127 (01):