Geminate charge recombination with distance-dependent intrinsic reaction rate: Escape probability and its electric field effect

被引:21
|
作者
Wojcik, M
Tachiya, M
机构
[1] Tech Univ Lodz, Inst Appl Radiat Chem, PL-93590 Lodz, Poland
[2] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058565, Japan
关键词
D O I
10.1016/j.radphyschem.2005.04.005
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We calculate the electric field dependence of the probability of escape from geminate recombination in the case of a finite, distance-dependent intrinsic reaction rate. We solve a partial differential equation for the escape probability using a numerical method. We assess the role of finite-reactivity effects in geminate recombination and discuss their possible consequences for interpretation of experimental data. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:132 / 138
页数:7
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