Nonlinear measurement of mid-infrared absorption in AlOx waveguides

被引：10

作者：

Ravaro, M. ^{[1
]}

Guillotel, E. ^{[1
]}

Le Du, M. ^{[1
]}

Manquest, C. ^{[1
]}

Marcadet, X. ^{[2
]}

Ducci, S. ^{[1
]}

Berger, V. ^{[1
]}

Leo, G. ^{[1
]}

机构：

[1] Univ Paris Diderot, Lab Mat & Phenomenes Quant, CNRS, UMR 7162, F-75205 Paris 13, France

[2] Alcatel Thales III V Lab, Route Dept 128, F-91767 Palaiseau, France

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 15期

关键词：

D O I：

10.1063/1.2911747

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report a quantitative study on the absorption of oxidized-AlAs (AlOx) integrated thin layers in the mid-infrared range (2-4 mu m). An AlOx absorption coefficient of 1600 cm(-1) is measured in a nonlinear waveguide, by investigating the phase-matching bandwidth of parametric fluorescence. Since mid-infrared optical losses of the idler mode are inferred from the corresponding signal features in the 1-2 mu m range, our technique takes advantage of common near-infrared sources and detectors. (C) 2008 American Institute of Physics.

引用

页数：3

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