Subthreshold performance of pocket-implanted silicon-on-insulator CMOS devices and circuits for ultra-low-power analogue/mixed-signal applications

被引:2
|
作者
Chakraborty, S. [1 ]
Mallik, A. [2 ]
Sarkar, C. Kr [3 ]
机构
[1] Tyfone Commun Dev India Pvt Ltd, ITPL, Bangalore 560066, Karnataka, India
[2] Univ Calcutta, Dept Elect Sci, Kolkata 700009, India
[3] Jadavpur Univ, Dept Elect & Telecommun Engn, Kolkata 700032, India
关键词
RELIABILITY; OPERATION;
D O I
10.1049/iet-cds.2010.0299
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Analogue circuits based on subthreshold operation of the devices are very attractive as they show significantly better performance in terms of both power dissipation and voltage gain. A systematic investigation, with the help of extensive process and device simulations, of the effects of halo doping [both double-halo and single-halo or lateral asymmetric channel (LAC)] on the subthreshold analogue performance of 100 nm silicon-on-insulator CMOS devices and circuits is reported for the first time. Although the halo doping is found to improve the subthreshold performance in general, the improvement is significant for a low tilt angle of the halo implant. The optimisation of the analogue performance is made for the halo devices by varying the tilt angle of the halo implant. CMOS amplifiers made with the halo-implanted devices are found to have higher voltage gain over their conventional counterpart, and a more than 70% improvement in the voltage gain is observed when both n- and p-channel transistors in the amplifier are LAC devices.
引用
收藏
页码:343 / 350
页数:8
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