Low-impedance time-domain reflectometry for measuring the impedance characteristics of low-impedance transmission lines

被引：4
|
作者：
Paulter, NG [1 ]
Palm, RH
Hefner, AR
Berning, DW
机构：
[1] NIST, Div Elect, Gaithersburg, MD 20899 USA
[2] NIST, Div Semicond Elect, Gaithersburg, MD 20899 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 12期
关键词：
D O I：
10.1063/1.1622981
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
An experimental examination of a 10 Omega and a 2 Omega time-domain reflectometer (TDR) technique for measuring low-impedance transmission line characteristics is presented. TDR measurements using these systems are compared to those using a 50 Omega TDR system. The results show that the uncertainties in the characteristic impedance, Z(C), of a low-Z(C) transmission line are a significant fraction of Z(C) for 50 Omega TDR measurements, whereas the fractional uncertainties are much less when using a low-impedance TDR. The fractional Z(C) uncertainties for the 50 Omega TDR increase as Z(C) decreases. (C) 2003 American Institute of Physics.
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页码：5204 / 5211
页数：8
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