Measurement of charge density in nanoscale materials using off-axis electron holography

被引：13

作者：

Zheng, Fengshan ^{[1
,2
]}

Caron, Jan ^{[1
,2
]}

Migunov, Vadim ^{[1
,2
,3
]}

Beleggia, Marco ^{[4
]}

Pozzi, Giulio ^{[1
,2
,5
]}

Dunin-Borkowski, Rafal E. ^{[1
,2
]}

机构：

[1] Forschungszentrum Julich, Ernst Ruska Ctr Microscopy & Spect Electrons, D-52425 Julich, Germany

[2] Forschungszentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany

[3] Rhein Westfal TH Aachen, Cent Facil Electron Microscopy GFE, Ahornstr 55, D-52074 Aachen, Germany

[4] Tech Univ Denmark, DTU Nanolab, DK-2800 Lyngby, Denmark

[5] Univ Bologna, Dept Phys & Astron, Viale Berti Pichat 6-2, I-40127 Bologna, Italy

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2020年 / 241卷 / 241期

基金：

欧盟地平线“2020”;

关键词：

Charge density; Off-axis electron holography; Transmission electron microscopy; Model-based iterative reconstruction; Electric field; Electrostatic potential; FIELD-EMISSION;

D O I：

10.1016/j.elspec.2019.07.002

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Three approaches for the measurement of charge density distributions in nanoscale materials from electron optical phase images recorded using off-axis electron holography are illustrated through the study of an electrically biased needle-shaped sample. We highlight the advantages of using a model-based iterative algorithm, which allows a priori information, such as the shape of the object and the influence of charges that are located outside the field of view, to be taken into account. The recovered charge density can be used to infer the electric field and electrostatic potential.

引用

页数：18

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