Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization

被引：9
|
作者：
Shur, VY [1 ]
Negashev, SA
Subbotin, AL
Pelegov, DV
Borisova, EA
Blankova, EB
Trolier-McKinstry, S
机构：
[1] Ural State Univ, Inst Phys & Appl Math, Ekaterinburg 620083, Russia
[2] Penn State Univ, Intercoll Mat Res Lab, University Pk, PA 16802 USA
来源：
PHYSICS OF THE SOLID STATE | 1999年 / 41卷 / 02期
基金：
俄罗斯基础研究基金会;
关键词：
D O I：
10.1134/1.1130767
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities D-s. The experimental dependences D-s(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film). (C) 1999 American Institute of Physics. [S1063-7834(99)02302-3].
引用
收藏
页码：274 / 277
页数：4
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