Trace element analysis of precious metals in minerals by time-of-flight resonance ionization mass spectrometry (TOF-RIMS)

被引：0

作者：

Dimov, SS ^{[1
]}

Chryssoulis, SL ^{[1
]}

Lipson, RH ^{[1
]}

机构：

[1] Univ Western Ontario, AMTEL, Res Pk, London, ON N6G 4X8, Canada

来源：

RESONANCE IONIZATION SPECTROSCOPY 2000 | 2001年 / 584卷

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D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The TOF-RIMS Mass Spectrometer, developed at AMTEL, has been successfully applied for quantitative trace element analysis of An, Pd and Rh in sulphides, iron oxides and silicates. A series of experiments were conducted in order to test the applicability and determine the detection sensitivity of several one and two step resonant ionization schemes related to An. Pd and Rh. The experimental data are compared with the corresponding theoretical estimates. Attained minimum detection limits are in the 8-17 ppb range with precision of +/- 15%. A comparative study of minerals by Dynamic SIMS and TOF-RIMS in the overlapping range of detection sensitivities for An, Pd and Rh shows good correlation of the quantified data.

引用

页码：46 / 51

页数：6

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