Exit problems for spectrally negative Levy processes reflected at either the supremum or the infimum

被引:21
|
作者
Zhou, Xiaowen [1 ]
机构
[1] Concordia Univ, Dept Math & Stat, Montreal, PQ H3G 1M8, Canada
关键词
spectrally negative Levy process; reflected Levy process; fluctuation theory; exit problem; excursion; risk model; ruin time;
D O I
10.1239/jap/1197908821
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
For a spectrally negative Levy process X on the real line, let S denote its supremum process and let I denote its infimum process. For a > 0, let tau (a) and K (a) denote the times when the reflected processes (Y) over cap := S - X and Y := X - I first exit level a, respectively; let tau_(a) and K_(a) denote the times when X first reaches S-tau(a) and I-k(a), respectively. The main results of this paper concern the distributions of (tau (a), S-tau(a), tau-(a), (Y) over cap (tau(a))) and of (K(a), I-k(a), k_(a)). They generalize some recent results on spectrally negative Levy processes. Our approach relies on results concerning the solution to the two-sided exit problem for X. Such an approach is also adapted to study the excursions for the reflected processes. More explicit expressions are obtained when X is either a Brownian motion with drift or a completely asymmetric stable process.
引用
收藏
页码:1012 / 1030
页数:19
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