Soldering defect detection in automatic optical inspection

被引:75
|
作者
Dai, Wenting [1 ]
Mujeeb, Abdul [2 ]
Erdt, Marius [3 ]
Sourin, Alexei [1 ]
机构
[1] Nanyang Technol Univ, Sch Comp Sci & Engn, Singapore, Singapore
[2] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore, Singapore
[3] Nanyang Technol Univ, Fraunhofer Res Ctr, Singapore, Singapore
基金
新加坡国家研究基金会;
关键词
Automatic Optical Inspection (AOI); Localization and classification of solder joint defects; Semi-supervised learning; YOLO; Clustering; Active learning; JOINT INSPECTION; NEURAL-NETWORK; CLASSIFICATION;
D O I
10.1016/j.aei.2019.101004
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper proposes an integrated detection framework of solder joint defects in the context of Automatic Optical Inspection (AOI) of Printed Circuit Boards (PCBs). Both localization and classifications tasks were considered. For the localization part, in contrast to the existing methods that are highly specified for particular PCBs, we used a generic deep learning method which can be easily ported to different configurations of PCBs and soldering technologies and also gives real-time speed and high accuracy. For the classification part, an active learning method was proposed to reduce the labeling workload when a large labeled training database is not easily available because it requires domain-specified knowledge. The experiments show that the localization method is fast and accurate. In addition, high accuracy with only minimal user input was achieved in the classification framework on two different datasets. The results also demonstrated that our method outperforms three other active learning benchmarks.
引用
收藏
页数:7
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