Dielectric behavior of polyetheretherketone (PEEK) using TSDC technique

被引:6
|
作者
Kalia, Rajesh [1 ]
Sharma, Vandana [1 ]
Sharma, J. K. [1 ]
机构
[1] Maharishi Markandeshwar Univ, Dept Phys, Ambala 133207, Haryana, India
关键词
Thermally stimulated discharge current; Glass transition temperature; Poling temperature; Poling field; Relaxation; THERMALLY STIMULATED DISCHARGE; GLASS-TRANSITION; RELAXATION; POLARIZATION; DEPOLARIZATION; SPECTROSCOPY; CONDUCTION; POLYIMIDE; CURRENTS; SAMPLES;
D O I
10.1007/s10965-012-9826-4
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The dielectric relaxation behavior of Polyetheretherketone (PEEK) has been investigated by using thermally stimulated discharge current (TSDC) technique. The dependence of TSDC characteristics of PEEK on poling temperature (T-P) [50-200 degrees C], poling field (E-P) [200-500 kV/cm], storage time (t(S)) [2-120 hrs] and various thicknesses 25 mu m, 50 mu m and 75 mu m have been investigated in the temperature range [60-230 degrees C]. The TSDC spectra shows a prominent maxima around glass transition temperature (T-g) i.e. at 143 degrees C named as alpha-peak and the other peak is observed around 200 degrees C named as beta-peak. The alpha-dipolar relaxation is taking place because of the movement of ketone (>C=0) dipoles linked to the main chain. The beta-peak is attributed to the space charges. It is observed that the magnitude of alpha-peak increases with the increase in poling field. The peak current and area under the alpha-peaks are found to be diminished with the increase of storage time (t(s)) for electrets. The amplitude of alpha-peak decreases with the increase in thickness. The activation energies for PEEK sample at different conditions in the present work are found to be 0.38 eV-1.70 eV. The values of activation energy (U) and pre-exponential factor (tau(o)) for alpha-relaxation are determined using Bucci plot method and support the nature of the relaxations.
引用
收藏
页数:9
相关论文
共 50 条
  • [1] Dielectric behavior of polyetheretherketone (PEEK) using TSDC technique
    Rajesh Kalia
    Vandana Sharma
    J. K. Sharma
    [J]. Journal of Polymer Research, 2012, 19
  • [2] Investigation of Dielectric Relaxation Parameters of Polyetheretherketone (PEEK) Films Using TSDC Technique
    Kalia, Rajesh
    Kalia, Sapna
    [J]. JOURNAL OF POLYMER MATERIALS, 2012, 29 (03): : 293 - 300
  • [3] Dielectric relaxation behavior of C5+ (70 MeV) swift heavy ion irradiated polyetheretherketone (PEEK) using TSDC technique
    Rajesh Kalia
    Vandana Sharma
    Satish K. Mahna
    Jatinder K. Sharma
    [J]. Polymer Science Series A, 2014, 56 : 837 - 843
  • [4] Dielectric Relaxation Behavior of C5+ (70 MeV) Swift Heavy Ion Irradiated Polyetheretherketone (PEEK) using TSDC Technique
    Kalia, Rajesh
    Sharma, Vandana
    Mahna, Satish K.
    Sharma, Jatinder K.
    [J]. POLYMER SCIENCE SERIES A, 2014, 56 (06) : 837 - 843
  • [5] The rheological behavior of polyetheretherketone (PEEK) polyetherimide (PEI) blends
    Frigione, M
    Naddeo, C
    Acierno, D
    [J]. JOURNAL OF POLYMER ENGINEERING, 1997, 16 (03) : 217 - 229
  • [6] Polyetheretherketone (PEEK) in Dentistry
    Benakatti, Veena B.
    Sajjanar, Jayashree A.
    Acharya, Aditya
    [J]. JOURNAL OF CLINICAL AND DIAGNOSTIC RESEARCH, 2019, 13 (08) : ZE10 - ZE12
  • [7] Polyetheretherketone (PEEK) as a Biomaterial: An Overview
    Moharil, Shambhavi
    Reche, Amit
    Durge, Khushboo
    [J]. CUREUS JOURNAL OF MEDICAL SCIENCE, 2023, 15 (08)
  • [8] Polyetheretherketone (PEEK) for medical applications
    Panayotov, Ivan Vladislavov
    Orti, Valerie
    Cuisinier, Frederic
    Yachouh, Jacques
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN MEDICINE, 2016, 27 (07)
  • [9] Polyetheretherketone (PEEK) for medical applications
    Ivan Vladislavov Panayotov
    Valérie Orti
    Frédéric Cuisinier
    Jacques Yachouh
    [J]. Journal of Materials Science: Materials in Medicine, 2016, 27
  • [10] LASER ANNEALING OF POLYETHERETHERKETONE (PEEK)
    FANG, SJ
    SALOVEY, R
    ALLEN, SD
    [J]. POLYMER ENGINEERING AND SCIENCE, 1989, 29 (18): : 1241 - 1245