Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films

被引：0
|
作者：
Maximova, O. A. [1 ,2 ,3 ]
Kosyrev, N. N. [1 ,4 ]
Varnakov, S. N. [1 ,2 ]
Lyashchenko, S. A. [1 ,2 ]
Tarasov, I. A. [1 ,2 ]
Yakovlev, I. A. [1 ,2 ]
Maximova, O. M. [3 ]
Shevtsov, D. V. [1 ,2 ]
Ovchinnikov, S. G. [1 ,2 ,3 ]
机构：
[1] Kirensky Inst Phys, Krasnoyarsk 660036, Russia
[2] Reshetnev Siberian State Aerosp Univ, Krasnoyarsk 660014, Russia
[3] Siberian Fed Univ, Krasnoyarsk 660041, Russia
[4] Krasnoyarsk State Agrarian Univ, Achinsk Branch, Achinsk 662150, Russia
来源：
8TH JOINT EUROPEAN MAGNETIC SYMPOSIA (JEMS2016) | 2017年 / 903卷
基金：
俄罗斯基础研究基金会;
关键词：
D O I：
10.1088/1742-6596/903/1/012060
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
In this work we present the way of nanostructured films study by means of magneto-llipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.
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页数：3
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