Effect of conformal roughness on ferromagnetic resonance linewidth in thin Permalloy films

被引：6
|
作者：
Maranville, BB [1 ]
Mallett, J [1 ]
Moffat, TP [1 ]
McMichael, RD [1 ]
Chen, AP [1 ]
Egelhoff, WF [1 ]
机构：
[1] NIST, Div Met, Gaithersburg, MD 20899 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2005年 / 97卷 / 10期
关键词：
D O I：
10.1063/1.1860271
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The ferromagnetic resonance linewidth is a result of both intrinsic damping and contributions from inhomogeneities, which in thin films can be dominated by the roughness. Microstructural measurements and magnetization dynamics are reported here for 50-nm films of Permalloy deposited on substrates with controlled roughness. Ferromagnetic resonance measurements reveal a strong linewidth broadening that peaks when the magnetization is approximately 30 degrees from the in-plane direction. These results are compared with a recently developed two-magnon theory of resonance broadening due to inhomogeneous demagnetizing fields in a rough film.
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页数：3
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