Physical Properties of Self-polarized PZT Thin Films at Compositions around the Morphotropic Phase Boundary

被引：1
|
作者：
Araujo, E. B. [1 ]
Lima, E. C. [2 ]
Bdikin, I. K. [3 ]
Kholkin, A. L. [4 ]
机构：
[1] Univ Estadual Paulista, Fac Engn, Dept Fis & Quim, BR-15385000 Ilha Solteira, SP, Brazil
[2] Univ Fed Tocantins, BR-77500000 Porto, Brazil
[3] Univ Aveiro, Dept Mech Engn & TEMA, P-3810193 Aveiro, Portugal
[4] Univ Aveiro, Dept Mat & Ceram Engn, CICECO, P-3810193 Aveiro, Portugal
来源：
ELECTROCERAMICS VI | 2014年 / 975卷
关键词：
PZT films; self-polarization; piezoelectric;
D O I：
10.4028/www.scientific.net/AMR.975.9
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The physical properties of self-polarized PbZr1-xTixO3 thin films with no preferential orientation in a range of compositions 0.46 <= x <= 0.50 were investigated. Structural analysis revealed the coexistence of monoclinic-tetragonal and monoclinic-rhombohedral phases at compositions 0.46 <= x <= 0.49, where the monoclinic phase was in the majority and both the tetragonal and the rhombohedral phases in the minority. The dielectric permittivity (epsilon' = 447) reached its maximum at around composition x = 0.48. Asymmetries in the macroscopic and local hysteresis loops confirmed the existence of the self-polarization effect in the studied films.
引用
收藏
页码：9 / +
页数：3
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