Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry

被引:0
|
作者
Azzam, R. M. A. [1 ]
机构
[1] Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA
关键词
Ellipsometry; Surface roughness; Optical tunneling; Air gap thickness measurement; Frustrated total internal reflection; INDEX THIN-FILM; PHASE-SHIFTS; SCATTERING;
D O I
10.1016/j.tsf.2013.11.139
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Optical tunneling of collimated monochromatic light of wavelength lambda through an air gap of thickness d(x, y) between two stress-free transparent prisms of the same refractive index N at an angle of incidence phi > the critical angle is accompanied by spatially variable transmission differential phase shift Delta(t)(x, y) that can be measured by a straight-through imaging ellipsometer with suitable polarizing and analyzing optics and two-dimensional array detector. Operation under the condition of equal tunneling for the p and s polarizations at phi(e) = arcsin root 2/(N-2 +1) leads to an analytical solution for d(x, y) in terms of Delta(t)(x, y). (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:666 / 668
页数:3
相关论文
共 50 条
  • [1] Optical Measurement of Contact Forces Using Frustrated Total Internal Reflection
    Sharp, James S.
    Poole, Stuart F.
    Kleiman, Benjamin W.
    [J]. PHYSICAL REVIEW APPLIED, 2018, 10 (03):
  • [2] Dual optical tunneling times in frustrated total internal reflection
    Balcou, P
    Dutriaux, L
    [J]. PHYSICAL REVIEW LETTERS, 1997, 78 (05) : 851 - 854
  • [3] The role of surface roughness in total internal reflection ellipsometry of hybrid systems
    Balevicius, Z.
    Vaicikauskas, V.
    Babonas, G. -J.
    [J]. APPLIED SURFACE SCIENCE, 2009, 256 (03) : 640 - 644
  • [4] Resonant tunneling in frustrated total internal reflection
    Longhi, S
    [J]. OPTICS LETTERS, 2005, 30 (20) : 2781 - 2783
  • [5] Tunneling delays in frustrated total internal reflection
    Gehring, George M.
    Liapis, Andreas C.
    Boyd, Robert W.
    [J]. PHYSICAL REVIEW A, 2012, 85 (03):
  • [6] Analysis of particle contact using frustrated total internal reflection
    Mir Amid Hashemi
    Charles M. Heron
    [J]. Meccanica, 2019, 54 : 653 - 665
  • [7] Analysis of particle contact using frustrated total internal reflection
    Hashemi, Mir Amid
    Heron, Charles M.
    [J]. MECCANICA, 2019, 54 (4-5) : 653 - 665
  • [8] Photonic tunneling time in frustrated total internal reflection
    Stahlhofen, AA
    [J]. PHYSICAL REVIEW A, 2000, 62 (01): : 7
  • [9] Tunneling delay time in frustrated total internal reflection
    Winful, Herbert G.
    Zhang, Chao
    [J]. PHYSICAL REVIEW A, 2009, 79 (02):
  • [10] Comment on "Photonic tunneling time in frustrated total internal reflection"
    Li, CF
    [J]. PHYSICAL REVIEW A, 2002, 65 (06): : 3 - 66101