Experimental Verification of a Stochastic Topology Approach for High-Power Microwave Effects

被引：16
|
作者：
Li, Xin [1 ,2 ]
Meng, Cui [1 ,2 ]
Liu, Yinong [1 ,2 ]
Schamiloglu, Edl [3 ]
Hemmady, Sameer D. [3 ,4 ]
机构：
[1] Tsinghua Univ, Key Lab Particle & Radiat Imaging, Minist Educ, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China
[3] Univ New Mexico, Dept Elect & Comp Engn, Albuquerque, NM 87131 USA
[4] TechFlow Inc, TechFlow Sci, Albuquerque, NM 87111 USA
来源：
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2015年 / 57卷 / 03期
关键词：
Baum-Liu-Tesche (BLT) equation; High-power microwaves (HPM) effects; random coupling model (RCM); statistical electromagnetics; wave chaos; SCATTERING MATRICES; CAVITIES; STATISTICS; IMPEDANCE;
D O I：
10.1109/TEMC.2014.2384482
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The random coupling model (RCM) and Baum-Liu-Tesche EM topology have been well developed to describe the statistical fluctuation of the scattering and impedance matrices of wave-chaotic metallic-enclosed cavity, and the interaction of interconnected networks of complicated enclosures, respectively. In this paper, a stochastic approach that combines these two methods is tested and verified on a network of wave-chaotic metallic cavities, and induced voltage derived by this method is also compared with other methods.
引用
收藏
页码：448 / 453
页数：6
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