In and ex situ optical spectroscopy of HCI-bombarded solid surfaces

被引：7

作者：

Tona, M ^{[1
]}

Baba, Y

Takahashi, S

Nagata, K

Nakamura, N

Yoshiyasu, N

Yamada, C

Ohtani, S

机构：

[1] Japan Sci & Technol Agcy, Chofu, Tokyo 1828585, Japan

[2] Univ Electrocommun, Inst Laser Sci, Chofu, Tokyo 1828585, Japan

[3] Univ Electrocommun, Dept Appl Phys & Chem, Chofu, Tokyo 1828585, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 235卷

关键词：

highly charged ion; HCI; graphite; HOPG; Raman spectrum;

D O I：

10.1016/j.nimb.2005.03.221

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have observed Raman scattering from highly oriented pyrolytic graphite (HOPG) surfaces after irradiation with highly charged ions (HCIs) as ex situ spectroscopy. HCIs having various potential energies from 5 keV for Ar16+ to 99 keV for Xe50+ were normally incident onto HOPG surfaces with the same collision velocities (5 x 10(5) m/s). In all spectra at fluence of 1 x 10(11) ions/cm(2), disorder induced peaks (D peak) appeared around 1580 cm(-1) in addition to narrower peaks (G peak) which were also observed unirradiated HOPG at 1358 cm(-1). Relative intensities of the D peak with respect to the G peak increase gradually as increasing potential energies of the HCIs. This shows obviously the effect of potential energy deposition on structural deformation of HOPG. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：443 / 447

页数：5

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