Wide-Range Time-to-Digital Converter With 1-ps Single-Shot Precision

被引:40
|
作者
Keranen, Pekka [1 ]
Maatta, Kari [1 ]
Kostamovaara, Juha [1 ]
机构
[1] Univ Oulu, Elect Lab, Elect & Informat Engn Dept, Oulu 90014, Finland
基金
芬兰科学院;
关键词
Jitter; phase noise; time interval measurement; time-to-amplitude converter (TAC); time-to-digital converter (TDC); CMOS;
D O I
10.1109/TIM.2011.2122510
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high-resolution time-to-digital converter (TDC) was designed and tested. The converter is based on the fundamental method of counting the full clock cycles of a low-phase-noise reference clock and using a single-stage interpolating method employing time-to-amplitude converters that are based on Miller integrators. Counters and other control logic were implemented on a field-programmable gate array, and the interpolation units were constructed using discrete components. The single-shot precision of the uncompensated converter is about 1.8 ps over a time interval range of 0 to 328 mu s. Single-shot precision is limited by the nonlinearities of the interpolators. These measurement errors caused by the nonlinearities are systematic, and thus, precision can be improved to 1 ps by a simple integral nonlinearity compensation. Other important factors that contribute to single-shot precision are the N-cycle jitter of the reference clock and the noise generated by the TDC circuit itself. By careful design, these errors can be made small enough to achieve picosecond-level precision.
引用
收藏
页码:3162 / 3172
页数:11
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