Epitaxial growth of β-SiC on Si (100) by low energy ion beam deposition

被引:1
|
作者
Zhou, XT [1 ]
Sun, SX [1 ]
Peng, HY [1 ]
Wang, N [1 ]
Lee, CS [1 ]
Bello, I [1 ]
Lee, ST [1 ]
机构
[1] City Univ Hong Kong, Ctr Super Diamond & Adv Films, COSDAF, Dept Phys & Mat Sci, Kowloon, Hong Kong, Peoples R China
关键词
epitaxial growth; beta-SiC; ion beam;
D O I
10.1016/S0925-9635(01)00423-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epitaxial P-silicon carbide (SiC) films on mirror-polished (100) Si substrates were deposited using low energy (150 eV) ion beam modification at different ion doses (1 X 10(17)/CM2, 1 x 10(17)/cm(2), 1 x 10(18)/cm(2), 1 x 10(19)/cm(2)). The Si substrates were exposed to a broad ion beam of hydrocarbon, argon, and hydrogen ions, generated in a Kaufman ion source. These ions reacted with the Si substrates and formed the epitaxial beta -SiC films. Amorphous carbon films were generated on top of beta -SiC films. Some voids were found with transmission electron microscopy (TEM) at the interface between the Si substrate and the beta -SiC film. By studying the ion dose dependence of the quality and thickness of the SiC and amorphous carbon films, we suggest that the formation of the epitaxial beta -SiC was driven by thermal diffusion of Si atoms in SiC and preferential etching of non-epitaxial SiC crystals by H ions. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1927 / 1931
页数:5
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