ESD Troubleshooting Using Multi-level TLP

被引：0
|
作者：
Cao, Yiqun [1 ]
机构：
[1] Infineon Technol, D-85579 Neubiberg, Germany
来源：
2014 36TH ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM (EOS/ESD) | 2014年
关键词：
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
Standard TLP with 100ns pulse width often fail to reproduce anomalous ESD failures in products. However multi-level TLP based on the advanced hardware modifications and settings is capable of reproducing many such failures, hence significantly improving ESD troubleshooting. Representative case studies confirm the usefulness of this technique.
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页数：8
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