Bulk crystals to surfaces: Combining X-ray diffraction and atomic force microscopy to probe the structure and formation of crystal interfaces

被引：123

作者：

Ward, MD ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

来源：

CHEMICAL REVIEWS | 2001年 / 101卷 / 06期

关键词：

D O I：

10.1021/cr000020j

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The characterization of crystal interfaces and organized molecular arrays were investigated with X-ray diffraction and atomic force microscopy. The combination of interface structure characterization, kinetic measurements and bulk single crystal X-ray diffraction enabled the elucidation of the growth of crystals. The study of the molecular properties of the organized interfaces were important for developing strategies for controlling nucleation of crystalline phases and for the synthesis of specific polymorphs and thin crystalline films.

引用

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页码：1697 / 1725

页数：29

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