共 50 条
- [2] Program/erase dynamics and channel conduction in nanocrystal memories 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, 2003, : 549 - 552
- [4] Localization of SILC in Flash memories after program/erase cycling 40TH ANNUAL PROCEEDINGS: INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2002, : 1 - 6
- [5] Read disturb degradation mechanism for source erase flash memories. 1996 SYMPOSIUM ON VLSI TECHNOLOGY: DIGEST OF TECHNICAL PAPERS, 1996, : 242 - 243
- [8] A new physics-based model for TANOS memories program/erase IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2008, TECHNICAL DIGEST, 2008, : 555 - +
- [9] Comprehensive simulation of program, erase and retention in charge trapping flash memories 2006 INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2, 2006, : 128 - +
- [10] Brain proteins erase fear, researchers say JOURNAL OF THE AMERICAN DENTAL ASSOCIATION, 2002, 133 (09): : 1172 - 1172