Robust Affine Invariant Descriptors

被引:14
|
作者
Yang, Jianwei [1 ]
Chen, Zirun [1 ]
Chen, Wen-Sheng [2 ]
Chen, Yunjie [1 ]
机构
[1] Nanjing Univ Informat Sci & Technol, Coll Math & Phys, Nanjing 210044, Jiangsu, Peoples R China
[2] Shenzhen Univ, Coll Math & Computat Sci, Shenzhen 518060, Peoples R China
基金
美国国家科学基金会;
关键词
PATTERN-RECOGNITION; REPRESENTATION; OBJECTS;
D O I
10.1155/2011/185303
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An approach is developed for the extraction of affine invariant descriptors by cutting object into slices. Gray values associated with every pixel in each slice are summed up to construct affine invariant descriptors. As a result, these descriptors are very robust to additive noise. In order to establish slices of correspondence between an object and its affine transformed version, general contour (GC) of the object is constructed by performing projection along lines with different polar angles. Consequently, affine in-variant division curves are derived. A slice is formed by points fall in the region enclosed by two adjacent division curves. To test and evaluate the proposed method, several experiments have been conducted. Experimental results show that the proposedmethod is very robust to noise.
引用
收藏
页数:15
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