Effect of thermal annealing on microstructure and optical properties of silver-carbon nanocomposite thin films

被引:2
|
作者
Sakli, A. [1 ,2 ]
Lahmar, A. [1 ]
Gamra, D. [2 ]
Clin, M. [1 ]
Bouchriha, H. [2 ]
Lejeune, M. [1 ]
机构
[1] Univ Picardie Jules Verne, Lab Phys Matiere Condensee LPMC, F-80039 Amiens, France
[2] Fac Sci Tunis, Lab Mat Avances & Phenomenes Quant LMAPQ, Tunis 2092, Tunisia
关键词
Ag Nanoparticles; Silver-carbon nanocomposite; Optical property; Numerical calculations; Band gap energy; TIO2; PHOTOCATALYSIS; METAL NANOPARTICLES; PULMONARY TOXICITY; AU/TIO2; PARTICLES; METHANOL; WATER; INSTILLATION; DEGRADATION; RATS;
D O I
10.1016/j.matpr.2021.05.673
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We reported a novel and versatile processing for the synthesis of Ag-carbon nanocomposites using the combination of the sputtering and PECVD techniques. The influence of the thermal annealing on the sur -face morphology, the structure and the optical properties of these films was studied. The effective med-ium model was used to describe the spectrophotometric measurements. Numerical calculations were allowed determining optical constants. The calculated transition gap E-g was found to vary between 1 and 1.5 eV depending on the annealing temperature. These values are lower than those reported for stan-dard Ag-TiO2 and Ag-ZnO nanocomposites, which is promising for advanced optoelectronic devices. (C) 2021 Elsevier Ltd. All rights reserved. Selection and peer-review under responsibility of the scientific committee of the 1st International Conference on Computations in Materials and Applied Engineering - 2021.
引用
收藏
页码:543 / 548
页数:6
相关论文
共 50 条
  • [1] Effect of rapid thermal annealing on the properties of thin carbon films
    Beshkov, G
    Velchev, N
    Tzenov, N
    Milenov, T
    Lazarova, V
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 38 (1-2): : 25 - 28
  • [2] Effect of Annealing Temperature on the Structural and Optical Properties of Silver Oxide Thin Films Prepared by Thermal Evaporation with Subsequent Annealing
    Chiyah, Basma
    Kayed, Kamal
    INTERNATIONAL JOURNAL OF NANOELECTRONICS AND MATERIALS, 2018, 11 (03): : 305 - 310
  • [3] Effect of thermal annealing on the metastable optical properties of GaN thin films
    Chang, Y. C.
    Kolbas, R. M.
    Reitmeier, Z. J.
    Davis, R. F.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2006, 24 (04): : 1051 - 1054
  • [4] Thermal annealing effect on optical properties of electrodeposited ZnO thin films
    Laurent, K.
    Yu, D. P.
    Tusseau-Nenez, S.
    Leprince-Wang, Y.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (19)
  • [5] OPTICAL-PROPERTIES AND MICROSTRUCTURE OF THIN SILVER FILMS
    DAVIS, CA
    MCKENZIE, DR
    MCPHEDRAN, RC
    OPTICS COMMUNICATIONS, 1991, 85 (01) : 70 - 82
  • [6] The Structural and Optical Properties of Silver Oxide Thin Films Synthesized by Thermal Evaporation of Silver with Subsequent Annealing
    Kamal Kayed
    Basma Chiyah
    Aerosol Science and Engineering, 2020, 4 : 271 - 276
  • [7] The Structural and Optical Properties of Silver Oxide Thin Films Synthesized by Thermal Evaporation of Silver with Subsequent Annealing
    Kayed, Kamal
    Chiyah, Basma
    AEROSOL SCIENCE AND ENGINEERING, 2020, 4 (04) : 271 - 276
  • [8] Effect of annealing on structural and optical properties of diamond-like nanocomposite thin films
    Jana, Sukhendu
    Das, Sayan
    De, Debasish
    Gangopadhyay, Utpal
    Ghosh, Prajit
    Mondal, Anup
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 114 (03): : 965 - 972
  • [9] Effect of annealing on structural and optical properties of diamond-like nanocomposite thin films
    Sukhendu Jana
    Sayan Das
    Debasish De
    Utpal Gangopadhyay
    Prajit Ghosh
    Anup Mondal
    Applied Physics A, 2014, 114 : 965 - 972
  • [10] Effect of thermal annealing on structural and optical properties of titanyl phthalocyanine thin films
    El-Nahass, M. M.
    Afify, H. A.
    Gadallah, A. -S.
    Hassanien, A. M.
    Khedr, M. Atta
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2014, 27 : 254 - 260