New approach for the molecular beam epitaxy growth of scalable WSe2 monolayers

被引:18
|
作者
Vergnaud, Celine [1 ]
Minh-Tuan Dau [1 ]
Grevin, Benjamin [2 ]
Licitra, Christophe [3 ]
Marty, Alain [1 ]
Okuno, Hanako [4 ]
Jamet, Matthieu [1 ]
机构
[1] Univ Grenoble Alpes, IRIG Spintec, Grenoble INP, CNRS,CEA, F-38000 Grenoble, France
[2] Univ Grenoble Alpes, CNRS, CEA, IRIG SYMMES, F-38000 Grenoble, France
[3] Univ Grenoble Alpes, CEA, LETI, Minatec Campus, F-38000 Grenoble, France
[4] Univ Grenoble Alpes, CEA, IRIG MEM, F-38000 Grenoble, France
关键词
2D materials; molecular beam epitaxy; electron microscopy; atomic force microscopy; x-ray diffraction; TRANSITION-METAL DICHALCOGENIDES; SCALE; PHOTOLUMINESCENCE; SE;
D O I
10.1088/1361-6528/ab80fe
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The search for high-quality transition metal dichalcogenides mono- and multi-layers grown on large areas is still a very active field of investigation. Here, we use molecular beam epitaxy to grow WSe2 on 15 x 15 mm large mica in the van der Waals regime. By screening one-step growth conditions, we find that very high temperature (>900 degrees C) and very low deposition rate (<0.15 angstrom min(-1)) are necessary to obtain high quality WSe2 films. The domain size can be as large as 1 mu m and the in-plane rotational misorientation of 1.25 degrees. The WSe2 monolayer is also robust against air exposure, can be easily transferred over 1 cm(2) on SiN/SiO2 and exhibits strong photoluminescence signal. Moreover, by combining grazing incidence x-ray diffraction and transmission electron microscopy, we could detect the presence of few misoriented grains. A two-dimensional model based on atomic coincidences between the WSe2 and mica crystals allows us to explain the formation of these misoriented grains and gives insight to achieve highly crystalline WSe2.
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页数:7
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