Design of semiconductor microcavity emitters and detectors for optical memory and interconnect systems

被引:0
|
作者
Lott, JA [1 ]
机构
[1] USAF, Inst Technol, Wright Patterson AFB, OH 45433 USA
来源
SEMICONDUCTOR LASERS III | 1998年 / 3547卷
关键词
vertical cavity surface emitting lasers; light-emitting diodes; photodetectors; optoelectronic integrated circuits;
D O I
10.1117/12.319637
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper presents a numerical design study of monolithically integrated microcavity detecting and emitting devices for applications in optical memory and interconnect systems. Combinations of 650 nm AlGaInP/AlGaAs resonant cavity light-emitting diodes and vertical cavity surface emitting lasers are examined. The device structures include resonant cavity p-i-n photodetectors embedded within distributed Bra,og reflector mirrors. The photodetectors consist of an undoped quantum well absorbing layer positioned at an antinode of the resonant standing wave. Classical spontaneous and stimulated emission intracavity absorption models are developed to estimate the embedded photodetector spectral responsivity. This embedded photodetector configuration provides an effective means for studying the spontaneous and stimulated emission components of microcavity light emitting devices.
引用
收藏
页码:168 / 178
页数:11
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