High Coverage Test for the Second Generation Current Conveyor

被引：0
|
作者：
Emara, A. S. [1 ]
Madian, A. H. [2 ]
Amer, H. H. [1 ]
Amer, S. H. [1 ]
机构：
[1] Amer Univ Cairo, Dept Elect Engn, Cairo, Egypt
[2] Egyptian Atom Energy Author, Radiat Engn Dept, Cairo, Egypt
来源：
2015 IEEE CONFERENCE ON ELECTRONICS, CIRCUITS, AND SYSTEMS (ICECS) | 2015年
关键词：
Second generation current conveyors; production testing; catastrophic faults; fault model; fault coverage; CIRCUITS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper addresses the issue of finding a high coverage minimum test set for the second generation current conveyors CCII. The circuit under test is used in active capacitance multipliers, V-I scalar circuits, Biquadratic filters and many other applications. This circuit is often used to implement voltage followers, current followers and voltage to current converters. Five faults are assumed per transistor. It is shown that, to obtain 100% fault coverage, the CCII has to be operated in voltage to current converter mode. Only two test values are required to obtain this fault coverage.
引用
收藏
页码：429 / 432
页数：4
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