Planar-doped gallium-arsenide structures for bulk potential barrier microwave diodes

被引:1
|
作者
Maleev, NA [1 ]
Egorov, AY
Zhukov, AE
Kovsh, AR
Ustinov, VM
Volkov, VV
Kokorev, MF
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] Svetlana Elektronpribor Inc, St Petersburg 194156, Russia
[3] St Petersburg State Elect Engn Univ, St Petersburg 197376, Russia
关键词
D O I
10.1134/1.1187692
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Diodes with a planar-doped potential barrier are devices with charge transfer by majority carriers for which the height of the potential barrier and the shape of the current-voltage characteristics can be controlled by means of a definite combination of layers during the growth of the epitaxial structures. These devices have emerged as potential replacements of Schottky-barrier diodes for a number of microwave applications. Some typical problems that arise when structures with a planar-doped potential barrier are grown by molecular-beam epitaxy are studied. A process for obtaining the structures, based on combining vapor-phase epitaxy with molecular-beam epitaxy, is proposed. Various methods are studied for forming ohmic contacts in structures with a planar-doped potential barrier. A process which provides low contact resistances (<6X10(-7) Ohm . cm(2)) and a high percentage yield of serviceable diodes (>95%) is developed. Microwave diodes fabricated with a planar-doped potential barrier are compared with Schottky diodes based on gallium arsenide. (C) 1999 American Institute of Physics. [S1063-7826(99)02003-7].
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页码:345 / 349
页数:5
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