The 6.1 Å family (InAs, GaSb, AlSb) and its heterostructures:: a selective review

被引:285
|
作者
Kroemer, H [1 ]
机构
[1] Univ Calif Santa Barbara, ECE Dept, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
来源
关键词
heterostructures; indium arsenide; antimonides; band lineup; quantum wells; superlattices; infrared detectors;
D O I
10.1016/j.physe.2003.08.003
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The three semiconductors InAs, GaSb, and AlSb form an approximately lattice-matched set around 6.1 Angstrom, covering a wide range of energy gaps and other properties. Of particular interest are heterostructures combining InAs with one or both of the antimonides, and they are emphasized in this review. In addition to their use in conventional device types (FETs, RTDs, etc.), several heterostructure configurations with unique properties have been explored, especially InAs/AlSb quantum wells and InAs/GaSb superlattices. InAs/AlSb quantum wells are an ideal medium to study the low-temperature transport properties in InAs itself. With gate-induced electron sheet concentrations on the order 10(12) cm(-2), they exhibit a pronounced conductivity quantization. The very deep wells (1.35 eV) provide excellent electron confinement, and also permit modulation doping up to at least 10(13) electrons cm(-2). Because of the very low effective mass in InAs, heavily doped wells are essentially metals, with Fermi energies around 200 meV, and Fermi velocities exceeding 10(8) cm s(-1). Contacted with superconducting electrodes, such structures can act as superconductive weak links. InAs/GaSb-related superlattices with their broken-gap lineup behave like semimetals at large lattice periods, but if the lattice period is shortened, increasing quantization effects cause a transition to a narrow-gap semiconductor, making such structures of interest for infrared detectors, often combined with the deliberate addition of strain. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:196 / 203
页数:8
相关论文
共 50 条
  • [1] RESONANT INTERBAND TUNNELING IN INAS/GASB/ALSB/INAS AND GASB/INAS/ALSB/GASB HETEROSTRUCTURES
    LONGENBACH, KF
    LUO, LF
    WANG, WI
    APPLIED PHYSICS LETTERS, 1990, 57 (15) : 1554 - 1556
  • [2] INTERBAND TUNNELING IN INAS/GASB/ALSB HETEROSTRUCTURES
    COLLINS, DA
    TING, DZY
    YU, ET
    CHOW, DH
    SODERSTROM, JR
    RAJAKARUNANAYAKE, Y
    MCGILL, TC
    JOURNAL OF CRYSTAL GROWTH, 1991, 111 (1-4) : 664 - 668
  • [3] In situ Raman spectroscopy of the selective etching of antimonides in GaSb/AlSb/InAs heterostructures
    Gatzke, C
    Webb, SJ
    Fobelets, K
    Stradling, RA
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (04) : 399 - 403
  • [4] Optical and structural investigation of InAs/AlSb/GaSb heterostructures
    Prevot, I
    Marcadet, X
    Durand, O
    Bisaro, R
    Julien, FH
    OPTICAL MATERIALS, 2001, 17 (1-2) : 193 - 195
  • [5] RESONANT TUNNELING IN POLYTYPE INAS/ALSB/GASB HETEROSTRUCTURES
    LONGENBACH, KF
    LUO, LF
    XIN, S
    WANG, WI
    JOURNAL OF CRYSTAL GROWTH, 1991, 111 (1-4) : 651 - 658
  • [6] INTERBAND TUNNELING IN POLYTYPE GASB/ALSB/INAS HETEROSTRUCTURES
    LUO, LF
    BERESFORD, R
    WANG, WI
    APPLIED PHYSICS LETTERS, 1989, 55 (19) : 2023 - 2025
  • [7] INTERBAND RESONANT TUNNELING AND TRANSPORT IN INAS/ALSB/GASB HETEROSTRUCTURES
    DAVIDOVICH, MA
    ANDA, EV
    TEJEDOR, C
    PLATERO, G
    PHYSICAL REVIEW B, 1993, 47 (08): : 4475 - 4484
  • [8] Dynamical conductance through InAs/GaSb/InAs and InAs/AlSb/GaSb/AlSb/InAs structures
    Ma, PW
    Wang, J
    PHYSICAL REVIEW B, 2004, 69 (12)
  • [9] Improved InAs/AlSb/GaSb heterostructures for quantum cascade laser applications
    Marcadet, X
    Prevot, I
    Becker, C
    Durand, O
    Bisaro, R
    Julien, FH
    Vinter, B
    Sirtori, C
    IN-PLANE SEMICONDUCTOR LASERS V, 2001, 4287 : 23 - 32
  • [10] In-situ monitoring of the selective etching of antimonides in GaSb/AlSb/InAs heterostructures using Raman spectroscopy
    Gatzke, C
    Webb, SJ
    Fobelets, K
    Stradling, RA
    COMPOUND SEMICONDUCTORS 1997, 1998, 156 : 337 - 340