Time resolved optical methods for investigation of phase transformations in materials exposed to nanosecond laser pulses

被引:0
|
作者
Martan, J. [1 ,2 ]
Semmar, N. [2 ]
Cibulka, O. [1 ]
机构
[1] Univ W Bohemia, Dept Phys, Univ 22, Plzen 30614, Czech Republic
[2] Univ Orleans, CNRS, GREMI, F-45067 Orleans, France
来源
关键词
infrared radiometry; time resolved reflectivity; nanosecond laser; phase transformations; melting threshold; melting duration; surface temperature measurement; TEMPERATURE-MEASUREMENT; THIN-FILMS; SILICON; FIELD;
D O I
10.1117/12.887581
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Infrared (IR) radiometry and time resolved reflectivity (TRR) methods can be used for investigation of laser pulse effects on materials in nanosecond time scale. The methods in combination are capable to quantify object temperature and detect phase transformations in the solid state, melting and plasma formation from vapour. Measurements with different laser pulse energy densities provide threshold of the transformation. The melt duration can be also determined. The experimental system is described. It contains KrF excimer laser with homogenizer and variable attenuator, fast IR detector for radiometry, continuous probing laser with Si photodiode for reflectivity measurement and UV detector for pump laser pulse reflection measurement. The system was applied to investigation of responses to laser light of silicon and different pure metals and alloys. The range of energy densities used was 1-5500 mJ. cm(-2) and measurements were done with temporal resolution of 6 ns for radiometry and 1 ns for reflectivity.
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页数:15
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