Linear Energy Transfer (LET) dependence of graphene oxide dosimeter for different ionizing radiations

被引:0
|
作者
Torrisi, L. [1 ,6 ]
Silipigni, L. [1 ,6 ]
Cutroneo, M. [2 ,6 ]
Proverbio, E. [3 ]
Torrisi, A. [4 ,5 ]
机构
[1] Univ Messina, MIFT, Dipto Sci Fis, Vle FS DAlcontres 31, I-98166 Messina, Italy
[2] CAS, Nucl Phys Inst, Hlavni 250, Husinec Rez 25068, Czech Republic
[3] Univ Messina, Dipto Ingn, I-98166 Messina, Italy
[4] Dipartimento Fis Lecce, I-73100 Lecce, Italy
[5] Ist Nazl Fis Nucl, Sez Lecce, I-73100 Lecce, Italy
[6] Ist Nazl Fis Nucl, Sez Catania, Viale A Doria 44, I-95123 Catania, Italy
关键词
Graphene oxide dosimetry; Linear energy transfer (LET); XPS spectroscopy; EDX analysis; Raman spectroscopy; X-RAY PHOTOELECTRON; VACUUM; FILMS;
D O I
10.1016/j.vacuum.2022.111240
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The graphene oxide (GO) reduction by ionizing radiation is proportional to the absorbed dose due to the energy release which produces ionizations, deexcitations, chemical bonding breaking, radical formation and recombination, oxygen functional groups and water desorption. Thanks to this, GO can be employed as a dosimeter whose dose can be measured using different analysis techniques, such as Raman spectroscopy, X-ray diffraction (XRD) and Energy Dispersive X-ray (EDX) analysis based on the characteristic X-ray emission, X-ray photoelectron spectroscopy (XPS). To evaluate the GO reduction as a function of the Linear Energy Transfer (LET) of the used radiation, measurements have been performed with XPS and EDX to deduce the C/O atomic ratio versus the X-rays, electron and ion beam energy loss. Results indicate that a linear dependence on LET occurs, as will be presented and discussed.
引用
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页数:8
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