V-shaped metallic-wire cantilevers for combined atomic force microscopy and Fowler-Nordheim imaging

被引：4

作者：

Peterson, CA ^{[1
]}

Workman, RK ^{[1
]}

Yao, XW ^{[1
]}

Hunt, JP ^{[1
]}

Sarid, D ^{[1
]}

机构：

[1] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA

来源：

NANOTECHNOLOGY | 1998年 / 9卷 / 04期

关键词：

D O I：

10.1088/0957-4484/9/4/005

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A method for fabricating V-shaped cantilevers from a flattened Pt/ir metal wire for combined atomic force microscopy and Fowler-Nordheim imaging is described. These novel cantilevers have been found to be more robust then conventional ones used for scanning capacitance and magnetic force microscopy as their conductivity is maintained even after a large number of surface scans. The use of a V-shaped geometry improves on earlier single-beam geometries by reducing rms imaging noise. Characterization of these cantilevers and combined atomic force microscopy and Fowler-Nordheim images are reported.

引用

页码：331 / 336

页数：6

共 18 条

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SURFACE AND INTERFACE ANALYSIS, 2006, 38 (06) : 1090 - 1095
[2] PARALLEL BEAM APPROXIMATION FOR V-SHAPED ATOMIC-FORCE MICROSCOPE CANTILEVERS
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[5] Effect of interactive damping on vibration sensitivities of V-shaped atomic force microscope cantilevers
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[6] Friction force microscopy measurements: Normal and torsional spring constants for V-shaped cantilevers
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[7] Sensitivity analysis of the nanoparticles on substrates using the atomic force microscope with rectangular and V-shaped cantilevers
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Zakeri, M.
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MICRO & NANO LETTERS, 2011, 6 (08): : 586 - 591
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MICROELECTRONIC ENGINEERING, 2011, 88 (11) : 3214 - 3218
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ULTRAMICROSCOPY, 2001, 86 (1-2) : 207 - 215
[10] FORCE TRANSDUCER MODELING OF RECTANGULAR, V-SHAPED, AND DAGGER CANTILEVER PROBES BASED ON ATOMIC FORCE MICROSCOPY
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