共 50 条
- [31] Large Area Metal Nanowire Arrays with Tunable Sub-20 nm NanogapsACS NANO, 2013, 7 (06) : 5223 - 5234Loan Le Thi Ngoc论文数: 0 引用数: 0 h-index: 0机构: Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlands Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, NetherlandsJin, Mingliang论文数: 0 引用数: 0 h-index: 0机构: Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlands Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands S China Normal Univ, South China Acad Adv Optoelect, Inst Elect Paper Display, Guangzhou, Guangdong, Peoples R China Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, NetherlandsWiedemair, Justyna论文数: 0 引用数: 0 h-index: 0机构: Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlands Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlandsvan den Berg, Albert论文数: 0 引用数: 0 h-index: 0机构: Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlands Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, NetherlandsCarlen, Edwin T.论文数: 0 引用数: 0 h-index: 0机构: Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlands Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands Univ Twente, BIOS Lab Chip Grp, NL-7500 AE Enschede, Netherlands
- [32] Sub-20 nm Trench Patterning with a Hybrid Chemical Shrink and SAFIER ProcessADVANCES IN RESIST MATERIALS AND PROCESSING TECHNOLOGY XXVI, 2009, 7273Chen, Yijian论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USAXu, Xumou论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USAChen, Hao论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USAMiao, Liyan论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USABlanco, Pokhui论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USACai, Man-Ping论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USANgai, Chris S.论文数: 0 引用数: 0 h-index: 0机构: Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA Appl Mat Inc, MTCG, Santa Clara, CA 95054 USA
- [33] High Temperature Performance of Flexible SOI FinFETs with Sub-20 nm Fins2014 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S), 2014,Diab, A.论文数: 0 引用数: 0 h-index: 0机构: King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi Arabia King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi ArabiaSevilla, G. A. Torres论文数: 0 引用数: 0 h-index: 0机构: King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi Arabia King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi ArabiaGhoneim, M. T.论文数: 0 引用数: 0 h-index: 0机构: King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi Arabia King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi ArabiaHussain, M. M.论文数: 0 引用数: 0 h-index: 0机构: King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi Arabia King Abdullah Univ Sci & Technol, Integrated Nanotechnol Lab, Thuwal, Saudi Arabia
- [34] A study of the reproducibility of electron beam induced deposition for sub-20 nm lithographyMICRO AND NANO ENGINEERING, 2019, 4 : 1 - 6Hari, Sangeetha论文数: 0 引用数: 0 h-index: 0机构: Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, NetherlandsVerduin, Thomas论文数: 0 引用数: 0 h-index: 0机构: Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, NetherlandsKruit, Pieter论文数: 0 引用数: 0 h-index: 0机构: Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, NetherlandsHagen, Cornelis W.论文数: 0 引用数: 0 h-index: 0机构: Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands Delft Univ Technol, Fac Appl Sci, Dept Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands
- [35] Comparative study of TDDB models on BEOL interconnects for sub-20 nm spacings2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,Mahmud, Niaz论文数: 0 引用数: 0 h-index: 0机构: SUNY Albany, Polytech Inst, CNSE, 257 Fuller Rd, Albany, NY 12203 USA SUNY Albany, Polytech Inst, CNSE, 257 Fuller Rd, Albany, NY 12203 USAAzhari, Nabihah论文数: 0 引用数: 0 h-index: 0机构: SUNY Albany, Polytech Inst, CNSE, 257 Fuller Rd, Albany, NY 12203 USA SUNY Albany, Polytech Inst, CNSE, 257 Fuller Rd, Albany, NY 12203 USALloyd, J. R.论文数: 0 引用数: 0 h-index: 0机构: SUNY Albany, Polytech Inst, CNSE, 257 Fuller Rd, Albany, NY 12203 USA SUNY Albany, Polytech Inst, CNSE, 257 Fuller Rd, Albany, NY 12203 USA
- [36] High aspect ratio InGaAs FinFETs with sub-20 nm fin width2016 IEEE SYMPOSIUM ON VLSI TECHNOLOGY, 2016,Vardi, Alon论文数: 0 引用数: 0 h-index: 0机构: MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA MIT, Microsyst Technol Labs, Cambridge, MA 02139 USALin, Jianqiang论文数: 0 引用数: 0 h-index: 0机构: MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA MIT, Microsyst Technol Labs, Cambridge, MA 02139 USALu, Wenjie论文数: 0 引用数: 0 h-index: 0机构: MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA MIT, Microsyst Technol Labs, Cambridge, MA 02139 USAZhao, Xin论文数: 0 引用数: 0 h-index: 0机构: MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA MIT, Microsyst Technol Labs, Cambridge, MA 02139 USAdel Alamo, Jesus A.论文数: 0 引用数: 0 h-index: 0机构: MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
- [37] Gate breakdown induced stuck bits in sub-20 nm FinFET SRAMAPPLIED PHYSICS LETTERS, 2024, 125 (02)Sun, Qian论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaChi, Yaqing论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaGuo, Yang论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaLiang, Bin论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaTao, Ming论文数: 0 引用数: 0 h-index: 0机构: Hunan Univ, Coll Elect & Informat Engn, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaWu, Zhenyu论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaGuo, Hongxia论文数: 0 引用数: 0 h-index: 0机构: Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaZheng, Qiwen论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Urumqi, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaChen, Wangyong论文数: 0 引用数: 0 h-index: 0机构: Sun Yat Sen Univ, Sch Microelect Sci & Technol, Guangzhou, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaGao, Yulin论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaZhao, Peixiong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Modern Phys, Lanzhou, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaLi, Xingji论文数: 0 引用数: 0 h-index: 0机构: Harbin Inst Technol, Technol Innovat Ctr Mat & Devices Extreme Environm, Harbin, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaChen, Jianjun论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaLuo, Deng论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaSun, Hanhan论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R ChinaFang, Yahao论文数: 0 引用数: 0 h-index: 0机构: Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Key Lab Adv Microprocessor Chips & Syst, Changsha, Hunan, Peoples R China Natl Univ Def Technol, Coll Comp Sci & Technol, Changsha, Hunan, Peoples R China
- [38] Nanosized-laser-induced sub-20 nm homogenous alloy nanoparticlesNANOTECHNOLOGY, 2024, 35 (46)Zhang, Chen论文数: 0 引用数: 0 h-index: 0机构: Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing 100190, Peoples R China Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R ChinaWang, Shu论文数: 0 引用数: 0 h-index: 0机构: Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing 100190, Peoples R China Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R ChinaYang, Yaqi论文数: 0 引用数: 0 h-index: 0机构: Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing 100190, Peoples R China Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R ChinaJiang, Chuanxiu论文数: 0 引用数: 0 h-index: 0机构: Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing 100190, Peoples R China Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R ChinaLiu, Xinfeng论文数: 0 引用数: 0 h-index: 0机构: Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing 100190, Peoples R China Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R ChinaLiu, Qian论文数: 0 引用数: 0 h-index: 0机构: Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China Univ Chinese Acad Sci, Beijing 100190, Peoples R China Nankai Univ, TEDA Appl Phys Sch, MOE Key Lab Weak Light Nonlinear Photon, Tianjin 300457, Peoples R China Univ Chinese Acad Sci, Natl Ctr Nanosci & Technol, Beijing, Peoples R China
- [39] Sub-20 nm multilayer nanopillar patterning for hybrid SET/CMOS integrationMICRO AND NANO ENGINEERING, 2020, 9Pourteau, M. -L.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceGharbi, A.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceBrianceau, P.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceDallery, J. -A.论文数: 0 引用数: 0 h-index: 0机构: Vistec Electron Beam GmbH, Ilmstr 4, D-07743 Jena, Germany Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceLaulagnet, F.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceRademaker, G.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceTiron, R.论文数: 0 引用数: 0 h-index: 0机构: Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceEngelmann, H. -J.论文数: 0 引用数: 0 h-index: 0机构: Helmholtz Zentrum Dresden Rossendorf, Bautzner Landstr 400, D-01328 Dresden, Germany Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, Francevon Borany, J.论文数: 0 引用数: 0 h-index: 0机构: Helmholtz Zentrum Dresden Rossendorf, Bautzner Landstr 400, D-01328 Dresden, Germany Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceHeinig, K. -H.论文数: 0 引用数: 0 h-index: 0机构: Helmholtz Zentrum Dresden Rossendorf, Bautzner Landstr 400, D-01328 Dresden, Germany Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceRommel, M.论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer IISB, Schottkystr 10, D-91058 Erlangen, Germany Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, FranceBaier, L.论文数: 0 引用数: 0 h-index: 0机构: Fraunhofer IISB, Schottkystr 10, D-91058 Erlangen, Germany Univ Grenoble Alpes, CEA, LETI, Platform Div, F-38000 Grenoble, France
- [40] Scalability Prespective of Nanotube TFET Capacitorless DRAM in Sub-20 nm Regime2024 IEEE LATIN AMERICAN ELECTRON DEVICES CONFERENCE, LAEDC, 2024,Kamal, Alok Kumar论文数: 0 引用数: 0 h-index: 0机构: ABV IIITM Gwalior, Dept Elect & Elect, Gwalior 474015, India ABV IIITM Gwalior, Dept Elect & Elect, Gwalior 474015, IndiaKamal, Neha论文数: 0 引用数: 0 h-index: 0机构: Indian Inst Technol Patna, Dept Elect Engn, Patna 801106, Bihar, India ABV IIITM Gwalior, Dept Elect & Elect, Gwalior 474015, IndiaLahgere, Avinash论文数: 0 引用数: 0 h-index: 0机构: Indian Inst Technol Kanpur, Dept Elect Engn, Kanpur 208016, Uttar Pradesh, India ABV IIITM Gwalior, Dept Elect & Elect, Gwalior 474015, India