Fault Localization Method by Partitioning Memory Using Memory Map and the Stack for Automotive ECU Software Testing

被引:3
|
作者
Kim, Kwanhyo [1 ]
Choi, Ki-Yong [1 ]
Lee, Jung-Won [1 ]
机构
[1] Ajou Univ, Dept Elect & Comp Engn, Suwon 16499, South Korea
来源
APPLIED SCIENCES-BASEL | 2016年 / 6卷 / 09期
基金
新加坡国家研究基金会;
关键词
Electronic Control Unit (ECU); automotive software; fault localization; embedded testing; memory map; Hardware in the Loop (HiL); memory update;
D O I
10.3390/app6090266
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Recently, the usage of the automotive Electronic Control Unit (ECU) and its software in cars is increasing. Therefore, as the functional complexity of such software increases, so does the likelihood of software-related faults. Therefore, it is important to ensure the reliability of ECU software in order to ensure automobile safety. For this reason, systematic testing methods are required that can guarantee software quality. However, it is difficult to locate a fault during testing with the current ECU development system because a tester performs the black-box testing using a Hardware-in-the-Loop (HiL) simulator. Consequently, developers consume a large amount of money and time for debugging because they perform debugging without any information about the location of the fault. In this paper, we propose a method for localizing the fault utilizing memory information during black-box testing. This is likely to be of use to developers who debug automotive software. In order to observe whether symbols stored in the memory have been updated, the memory is partitioned by a memory map and the stack, thus the fault candidate region is reduced. A memory map method has the advantage of being able to finely partition the memory, and the stack method can partition the memory without a memory map. We validated these methods by applying these to HiL testing of the ECU for a body control system. The preliminary results indicate that a memory map and the stack reduce the possible fault locations to 22% and 19% of the updated memory, respectively.
引用
收藏
页数:20
相关论文
共 20 条
  • [1] Fault Localization by Comparing Memory Updates between Unit and Integration Testing of Automotive Software in an Hardware-in-the-Loop Environment
    Choi, Ki-Yong
    Lee, Jung-Won
    APPLIED SCIENCES-BASEL, 2018, 8 (11):
  • [2] Software Localization: Translation Memory Using
    Sviridova, Tatyana
    Fadyeyeva, Kateryna
    EXPERIENCE OF DESIGNING AND APPLICATION OF CAD SYSTEMS IN MICROELECTRONICS: PROCEEDINGS OF THE XTH INTERNATIONAL CONFERENCE CADSM 2009, 2009, : 556 - 559
  • [3] Fault Localization Method by Utilizing Memory Map and Input-Driven Update Interval
    Kim, Kwanhyo
    Choi, Ki-Yong
    Lee, Jung-Won
    ADVANCED MULTIMEDIA AND UBIQUITOUS ENGINEERING: FUTURETECH & MUE, 2016, 393 : 181 - 188
  • [4] The Research Of Memory Fault Simulation And Fault Injection Method For BIT Software Test
    Xu, Jun
    Xu, Ping
    PROCEEDINGS OF THE 2012 SECOND INTERNATIONAL CONFERENCE ON INSTRUMENTATION & MEASUREMENT, COMPUTER, COMMUNICATION AND CONTROL (IMCCC 2012), 2012, : 718 - 722
  • [5] Fault Localization in Software Testing Using Soft Computing Approaches
    Singh, Pradeep Kumar
    Garg, Sheely
    Kaur, Mandeep
    Bajwa, Manpreet Singh
    Kumar, Yugal
    PROCEEDINGS OF 4TH INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING, COMPUTING AND CONTROL (ISPCC 2K17), 2017, : 627 - 631
  • [6] Testing of memory leak faults using automated software inspection
    Yang, ZH
    Xiao, Q
    Zhang, LX
    Bi, XJ
    ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 8, 2005, : 338 - 341
  • [7] Static Fault Localization on Memory Failures using Photon Emission Microscopy
    Dayanand, N.
    Quah, A. C. T.
    Chen, C. Q.
    Ang, G. B.
    Moon, S.
    Ng, H. P.
    Mai, Z. H.
    Lam, J.
    PROCEEDINGS OF THE 22ND INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2015), 2015, : 290 - 294
  • [8] Reduction of Fault Tolerant Memory Testing Problem Using Dynamic Fault Injection Technique
    Dey, Sowvik
    Das, Somak
    Karmakar, Amiya
    ADVANCED INFORMATICS FOR COMPUTING RESEARCH, ICAICR 2019, PT II, 2019, 1076 : 35 - 44
  • [9] StealthTest: Low Overhead Online Software Testing using Transactional Memory
    Bobba, Jayaram
    Xiong, Weiwei
    Yen, Luke
    Hill, Mark D.
    Wood, David A.
    18TH INTERNATIONAL CONFERENCE ON PARALLEL ARCHITECTURES AND COMPILATION TECHNIQUES, PROCEEDINGS, 2009, : 146 - +
  • [10] A memory allocation and assignment method using multi-way partitioning
    Kim, N
    Peng, R
    IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2004, : 143 - 144