Effect of thermal strain in helical slow-wave circuit on TWT cold-test characteristics

被引：12
|
作者：
Yan, Shengmei [1 ]
Yao, Lieming [1 ]
Yang, Zhonghai [1 ]
机构：
[1] Univ Elect Sci & Technol China, Vacuum Elect Natl Lab, Sch Phys Elect, High Energy Elect Res Inst, Chengdu 610054, Peoples R China
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 2008年 / 55卷 / 08期
关键词：
ANSYS; cold-test characteristics; MAFIA; thermal strain; traveling wave tube (TWT);
D O I：
10.1109/TED.2008.926725
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A simulated model has been established to calculate the temperature of helical slow-wave circuits accurately. The finite-element-method software ANSYS was used to analyze the thermal distortion of the traveling-wave-tube (TWT) helical slow-wave circuit. The thermal-analysis results show that the thermal stress deforms the helix primarily at the positions contacting the support rods and that the expansion of the helical tape width and thickness are very small and can be ignored. The effect of thermal strain on the helical slow-wave circuit cold-test characteristics was analyzed in detail. The periodic boundary conditions in the computer code MAFIA were employed to determine the effect on dispersion and on-axis interaction impedance. With increased helix temperature, the phase velocity decreases significantly, and the interaction impedance varies slightly.
引用
收藏
页码：2278 / 2281
页数：4
相关论文
共 50 条
  • [1] Effect of Thermal strain in helical slow-wave circuit on TWT Cold-test characteristics
    Yao, Lieming
    Yang, Zhonghai
    Huo, Zhongsheng
    Zhu, Xiaofang
    Li, Bin
    EIGHTH IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE, 2007, : 103 - +
  • [2] Effect of helical slow-wave circuit variations on TWT cold-test characteristics
    Kory, CL
    Dayton, JA
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (04) : 972 - 976
  • [3] Effect of helical slow-wave structure parameter variations on TWT cold-test characteristics
    Li, S
    Liu, W
    Su, XB
    Yin, HJ
    IVESC2004: THE 5TH INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE PROCEEDINGS, 2004, : 393 - 395
  • [4] Effect of pressed helix in helical slow-wave structure on TWT cold-test characteristics
    Li, Shi
    Liu, Wei
    Su, Xiao-Bao
    Yin, He-Jun
    Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams, 2004, 16 (09): : 1186 - 1190
  • [5] Accurate cold-test model of helical TWT slow-wave circuits
    Analex Corporation/NASA Lewis Research Center, Cleveland, OH 44135, United States
    不详
    IEEE Trans. Electron Devices, 4 (966-971):
  • [6] Accurate cold-test model of helical TWT slow-wave circuits
    Kory, CL
    Dayton, JA
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (04) : 966 - 971
  • [7] Simulation of cold-test characteristics for TWT slow-wave structures
    Han Bo
    Su Xiao-bao
    2005 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS 1-5, 2005, : 1149 - 1152
  • [8] Simulation of thermal characteristics for helical slow-wave circuit of TWT
    Lieming Yao
    Zhonghai Yang
    Zhongsheng Huo
    Xiaofang Zhu
    2007 5TH INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, 2007, : 581 - +
  • [9] Research of dual-helical coupled slow-wave circuit cold-test characteristics in CFA
    Zhang Jinling
    Lu Yinghua
    Zhang Hongxin
    Xu Yong
    Zheng Zhanqi
    Zhang Bo
    Wang Dengwei
    Yang Jinsheng
    Su Yuansheng
    2007 4TH INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY PROCEEDING: EMC 2007, 2007, : 325 - +
  • [10] Three-dimension software cold-test simulation of coupled cavity slow-wave circuit
    Lei, Wenqiang
    Yang, Zhonghai
    Gao, Yuanci
    Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China, 2002, 31 (05):
12345