Active spectro-polarimetric imaging: signature modeling, imaging demonstrator and target detection

被引:12
|
作者
Alouini, M. [1 ]
Goudail, F. [2 ]
Roux, N. [3 ]
Le Hors, L. [4 ]
Hartemann, P. [1 ]
Breugnot, S. [4 ]
Dolfi, D. [1 ]
机构
[1] Thales Res & Technol France, F-91767 Palaiseau, France
[2] Univ Paris Sud, CNRS, Lab Charles Fabry, Inst Opt, F-91127 Palaiseau, France
[3] Domaine Univ St Jerome, Phys & Image Processing Grp, Fresnel Inst, F-13397 Marseille 20, France
[4] Thales Oprton Thales Optron SA, F-78283 Guyancourt, France
来源
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2008年 / 42卷 / 02期
关键词
D O I
10.1051/epjap:2008034
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the synthesis of our work on the analysis of active spectro-polarimetric imaging concept of real-world scenes. These synthesis extend from the investigation of depolarization mechanisms up to image analysis and processing. We show in particular that depolarization effects are wavelength dependent and strongly correlated with light absorption of materials. Multi-wavelength images of degree of polarization are recorded and analyzed, evidencing that the polarimetric image must be interpreted in conjunction with its counterpart intensity image in order to extract, the most relevant information from the scene. For real field operation, the noise characteristics of polarimetric images are also investigated under coherent laser illumination. The potential increase of target detection performance brought by properly processing the active polarimetric image is illustrated on a very low contrast scene.
引用
收藏
页码:129 / 139
页数:11
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