Low-Noise 3-D Avalanche Photodiodes

被引:3
|
作者
Wu, Zhiwei [1 ]
Guo, Jingshu [1 ]
Li, Yuan [1 ]
Zhao, Yanli [1 ]
机构
[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China
来源
IEEE PHOTONICS JOURNAL | 2016年 / 8卷 / 04期
基金
中央高校基本科研业务费专项资金资助;
关键词
Avalanche photodiode (APD); 3-D; dead space; low noise; IMPACT-IONIZATION; CHARGE LAYER; DEAD SPACE; GAAS; GAIN; COEFFICIENTS; SI;
D O I
10.1109/JPHOT.2016.2578932
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we present a new 3-D structure for the InP-based avalanche photodiode, aiming at decreasing the excess noise factor. To the best of our knowledge, it is the first time new device designs based on the recently developed 3-D spatial dead space model in 2014 have been proposed. In addition, we also propose a methodology, i.e., the 2-D planar absorption distribution projection technique, for further optimizing the 3-D model. According to our theoretical simulation results, by combining photonic crystal and selective area doping, the effective k values of InP and In0.52Al0.48As can be reduced to as low as similar to 0.19 and as similar to 0.13, respectively. Meanwhile, the optimal thickness of the multiplication region is larger than 0.45 mu m, which reduces the tunneling effect. The detailed parameter optimization process, including optics, electronics, and material, is comprehensively presented. The examples in this paper also provide a fresh idea for researchers to foretell and design new photodetectors with the 3-D structure.
引用
收藏
页数:10
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