Reliability-Aware Design Automation Flow for Analog Circuits

被引:0
|
作者
Liu, Chien-Nan Jimmy [1 ]
Chen, Yen-Lung [1 ]
Liu, Tsung-Yu [1 ]
Chen, Tai-Chen [1 ]
机构
[1] Natl Cent Univ, Dept Elect Engn, Jung Li City, Taiwan
关键词
analog design automation; circuit reliability;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Manually designing analog circuits is often considered as a difficult task that takes a lot of time. If a design automation environment is available for analog circuits, it is useful for designers to cope with the increasing challenges in advance process. In this paper, a reliability-aware circuit sizing technique is proposed to consider process variation, circuit aging, and layout-dependent effects simultaneously. A reliability-aware analog layout automation technique is also proposed to consider both placement and routing while improving the reliability of the generated layout. These reliability-aware design automation techniques have been integrated to build a complete synthesis environment from specifications to layout. As shown in the experimental results, the proposed automation flow does help designers solve the reliability issues efficiently.
引用
收藏
页码:1 / 2
页数:2
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