Research on Profile Vision Measurement Calibration

A calibration pattern with linear light method for profile vision measurement is proposed. A plan for calibration pattern is made which of the pattern pins can fold back to pattern plate in accordance with rows separately. The unfolding pattern pins are photographed with linear light crossing that vertically one row at a time. The mathematical expression of transforming physical plane into pixel plane is derived by physical coordinates and pixel coordinates. With the least-square method the calibration coefficient is made. The method is validated through the means that magnetic gauge block used as a higher precision measurement standard is close to the profile. The experiment indicates that it is avoided that the pattern pins from different rows interrupt the linear light, and the profile measurement error is better than 0.2 mm.